• General
  • Api Documentation

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    • OmicronLab.MaterialAnalyzer.AutomationInterface
      • BaseFdsResult
      • BasePdcResult
      • CombinedFrequencySweepSettingsImplementation
      • FdsFrequencySweepSettingsImplementation
      • FrequencySweepSettingsBase
      • FrequencySweepSettingsFactory
      • MeasurementImplementation
      • MeasurementSettingsImplementation
      • PdcFrequencySweepSettingsImplementation
      • PreMeasurementImplementation
      • RecorderFdsResultImplementation
      • RecorderImplementation
      • RecorderPdcResultImplementation
      • ReferenceMeasurementImplementation
      • Spectano100
    • OmicronLab.MaterialAnalyzer.AutomationInterface.DataTypes
      • Complex
    • OmicronLab.MaterialAnalyzer.AutomationInterface.DataTypes.Interfaces
      • IComplex
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Enumerations
      • ApplyState
      • DeviceStatus
      • ExecutionState
      • FdsPdcConversionTime
      • LogLevel
      • MeasurementMode
      • NoiseSuppression
      • PreMeasurementDelayType
      • PreMeasurementState
      • QualityCheckState
      • ReconnectionState
      • RecorderState
      • ResultType
      • StopState
      • TestCellType
      • Trend
      • UploadState
    • OmicronLab.MaterialAnalyzer.AutomationInterface.EventHelper
      • DeviceEvents
      • FrequencySweepMeasurementEvents
      • PreMeasurementEvents
      • RecorderEvents
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Extensions
      • CommonExtension
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces
      • DeviceEventDelegates
      • DeviceEventDelegates.DeviceStatusChangedDelegate
      • DeviceEventDelegates.RuntimeErrorDelegate
      • SpectanoDevice
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Recording
      • Recorder
      • RecorderEventDelegates
      • RecorderEventDelegates.FdsResultAvailableDelegate
      • RecorderEventDelegates.PdcResultAvailableDelegate
      • RecorderEventDelegates.RecorderStatusChangedDelegate
      • Recording
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Recording.Results
      • RecorderFdsResult
      • RecorderPdcResult
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Sweep
      • Sweep
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Sweep.FrequencySweep
      • FrequencySweepEventDelegates
      • FrequencySweepEventDelegates.ExecutionProgressUpdateDelegate
      • FrequencySweepEventDelegates.NewFdsResultAvailableDelegate
      • FrequencySweepEventDelegates.NewPdcResultAvailableDelegate
      • FrequencySweepMeasurement
      • Results
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Sweep.FrequencySweep.PreMeasurements
      • PreMeasurement
      • PreMeasurementEventDelegates
      • PreMeasurementEventDelegates.QualityCheckStateDelegate
      • PreMeasurementEventDelegates.TimeDelayAndCurrentCheckerStateDelegate
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Sweep.FrequencySweep.ReferenceMeasurement
      • ReferenceMeasurement
      • ReferenceMeasurements
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.MeasurementModes.Sweep.FrequencySweep.Settings
      • CombinedFrequencySweepSettings
      • CustomCombinedFrequencySweepSettings
      • CustomFdsFrequencySweepSettings
      • CustomPdcFrequencySweepSettings
      • FdsFrequencySweepSettings
      • FrequencySweepSettings
      • MeasurementSettings
      • PdcFrequencySweepSettings
    • OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.TestCells
      • CylindricalElectrodesWithGuardRing
      • CylindricalElectrodesWithoutGuardRing
      • DiskElectrodesWithGuardRing
      • DiskElectrodesWithoutGuardRing
      • Dsh100
      • OtherTestCell
      • TestCell
      • TestCellSample
      • TestCellSampleReference
    • SpectanoAIExample
      • Program

    Interface TestCellSampleReference

    Test cell sample reference class.

    Namespace: OmicronLab.MaterialAnalyzer.AutomationInterface.Interfaces.TestCells
    Assembly: OmicronLab.MaterialAnalyzer.AutomationInterface.dll (1.60.627.0)
    Syntax
    public interface TestCellSampleReference
    Remarks

    Allows the configuration of the test cell sample reference related to an air reference measurement. A test cell sample reference always depends on the configured TestCell.

    Properties

    SampleThickness

    Gets or sets the sample thickness of the reference material (normally air) of disk test cells in m. Valid range: 1fm to 1km.

    Declaration
    double SampleThickness { get; set; }
    Property Value
    Type Description
    System.Double

    The sample thickness of the reference material for disk test cells in m.

    VacuumCapacitance

    Gets or sets the reference vacuum capacitance in F. The value needs to be greater than 0.

    Declaration
    double VacuumCapacitance { get; set; }
    Property Value
    Type Description
    System.Double

    The reference vacuum capacitance in F.

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